IRADETS performs radiation analysis and reports with its qualified staff in many domestic and international accredited facilities. Thanks to its expert and experienced staff, detailed radiation effects are studied on the component related to pre-irradiation training, preparation, simulation and recommendations, post-irradiation analysis, calculations and detailed report presentation.

The wide network established by IRADETS with domestic and international irradiation facilities can perform all kinds of irradiation services in these facilities with the priority of user advantage in ESA / JEDEC / MIL / ASTM standards. Detailed analysis and reports after irradiation are prepared in accordance with the standards and can suggest shielding, mitigation or alternative component / device solutions when necessary.

Preliminary investigation of single event effects (SEE) triggered by radiation on electronic components and VUV / UV tests on solar cell, optical material, composite or meta-materials can be done by the systems IRADETS developed and patented. IRADETS takes pride in been the one of the only companies in Europe and the only company in Turkey to comply with these high standarts.

Test Systems Developed by IRADETS and Recognized by ESA

LASER SYSTEM:

Simulation experiment setup that will create SEE effect on electronic components;

It can map the radiation sensitivity of an electronic component with micron sensitivity. It has the characteristics of creating SEE effects in the laboratory and controlling the entire system in the laboratory before taking it to the test for irradiation.

Advantages: To have a quick idea about the sensitivity, mapping, control, and durability of the component of different production groups or prototypes, at the micron level during the electronic design.


Customers: ESA / ESTEC; TESAT, CAEN, SITAEL, IMEC, STM

Publications or presentations made:

“The radiation sensitivity mapping of ICs using an IR pulsed laser system”, B.Alpat et al,  Microelectronics Reliability 43 (2003) 981–984.

“A pulsed nanosecond IR laser diode system to automatically test the Single Event Effects in the laboratory”, B.Alpat et. al,  Nucl. Ins. & Meth. in Phys. Res. A 485 (2002) 183–186.

“Radiation hardness assurance: Innovative aspects and challenges”, B.Alpat et al., Proc. of SPIE Vol. 11042 1104210-1

UV Tests

Tests of many materials such as optics, materials, composite materials, solar cells are carried out following the oscillation spectrum below the sun 200-400 nm and as recommended by the ESA/ECSS-Q-ST-70-06C standard.

Advantages: Real-time irradiation can be remotely controlled.

Technical specifications: Samples are placed on the bottom of a cylindrical irradiation chamber, which is closed by a quartz window. A Helios Quartz mercury lamp is placed over the window. After degassing (vacuum at 10-5 mbar), the chamber is filled with 1.1 bar of static He, which allows an adequate heat distribution during irradiation to keep the substrate temperature below 40 ° C. Includes air and water cooling systems, UV and visible light detectors temperature data acquisition system and a webcam for real-time remote control of the main experimental parameters over the entire irradiation period.

Customers: ESA, CONSORZIO CREO, TOSEDA 

Publications or presentations made:

“First Surface Flexible Optical Solar Reflectors with Interferential Cermet Coatings”, S. Mengali et al., Proceedings of the 14th ISMSE & 12th ICPMSE, Biarritz, France, 1 to 5 October 2018. 

”Test Di Substrati per Telescopi Spaziali: Irraggiamenti Nell’ultravioletto di Film Poliimmide in Aria, Vuoto E Atmosfera Controllata “, P. Di Lazzaro et al., ENEA Technical Report RT / 2017/9 / ENEA (2017). http://openarchive.enea.it/bitstream/handle/10840/8534/RT-2017-09-ENEA.pdf?sequence=1 

“Testing of Substrates for Flexible Optical Solar Reflectors: Irradiations of Nano-hybrid Coatings of Polyimide Films with 20 keV Electrons and with 200- 400 nm Ultraviolet Radiation”, B.Alpat et al., 2019 JINST 14 T06003″

SEM Tests

We can perform charge build up tests in accordance with ESA (European Space Agency) standards with SEM’s 20-40 keV electrons on any SEM (Scanning Electron Microscope) that has certain technical features with our own method. The method we developed was used in two ESA projects on an SEM at Sabancı University, so its validity was approved by ESA delegations.

Technical specifications: Electron energy is used as the working point where the electron beam unfolds on this surface physically below the normal working point in SMs whose density is suitable for the optical aperture.

Advantages: There are very few ad-hoc developed facilities for this test and they are not sufficient for the needs. The most important of these is ESA-ESTEC. Any SEM (which includes the majority of this) that can be applied to this method can perform these tests.

Customers: ESA, Consorzio CReo

Publications or presentations made:

“Radiation hardness assurance: Innovative aspects and challenges”, B. Alpat et al., Proc. of SPIE Vol. 11042 1104210-1, 2019.